NSI-100V-1x1垂直平面近场量测系统

厂  牌 : NSI-MI

The 100V-1x1 is an ideal system for measuring high frequency medium and high gain antennas (>15 dBi) with small apertures. The 100V-1x1 is based on a vertical “T” frame design and is constructed of modular high precision linear stages. This simple design is portable and easy to align and can be quickly reconfigured to use both mm-Wave modules or traditional coaxially connected probes. The scanner is mounted on a 23.6” x 23.6” x 0.5” (600 mm x 600 mm x 12.7 mm) breadboard with M6 tapped holes on a 25 mm grid. The scanner includes a cable management system and can support probe payloads of up to 10 lb (4.5 kg).

The NSI-100V-1x1 System includes:

  • X-Y Vertical Planar Scanner with cable management system
  • Y tower absorber kit
  • Mounting plate with leveling feet
  • Motor control unit
  • Workstation computer with keyboard & monitor
  • NSI2000 Measurement and analysis software

The system interfaces with a wide variety of RF equipment and is ideal for characterizing small aperture antennas from 8.2 - 500 GHz. The system software runs on a Pentium based measurement workstation and provides automatic setup of scans based on measurement parameters and desired output. Measured data can be processed for far-field or holographic patterns yielding complete characterization of the antenna’s performance. A single data set provides complete characterization of the antenna’s gain, side lobes structure, beam pointing and cross polarization. The Model 100V-1x1 can be integrated with a mmWave VNA, providing a compact mm-Wave planar nearfield test package. RF up and down conversion modules can be mounted directly on the scanner, implying that NO cabling changes need to be made.

  • Low Cost & Portable
  • 1’ x 1’ (300 mm x 300 mm) Scan Area
  • 8.2 - 500 GHz Measurements
  • “T” Frame Design for High Accuracy
  • Far-field, Holographic and Near-field Pattern
SPECIFICATIONS
ConstructionVertical ‘T’ Frame (aluminum)
Drive systemPrecision Ball Screw
Scan Area1' x 1' (300 mm x 300 mm)
Planarity (RMS)<0.002” (0.05 mm)
Corrected Planarity (RMS)* Note: Requires optional Z/Roll stage; not available for use with mm-Wave modules<0.001” (0.025 mm)
Resolution (X,Y)0.002” (0.05 mm)
Postition Repeatability±0.0008" (±0.02 mm)
Scan Speed (X,Y)0.5 in/s (12.7 mm/s)
Probe Carriage Capacity10 lb (4.5 kg)
System ControllerNSI controller with parallel I/O, and serial interface.
Measurement WorkstationMeasurement workstation computer with large LCD monitor.
Stepper Motor Power AmpliferEIA 19” rack mount, 4U (7” high x 14” deep)
Motor CablesQuick-connect; 10’ (3 m)
Scanner AbsorberY tower absorber kit (1.5” convoluted)
ProbeOptional
Probe MountAngle Bracket
Supported RF DevicesNSI Panther, Agilent PNA or R&S ZVA Receiver Subsystem
Power100-240 VAC switchable; 47-63 Hz, 500 watts

- RF Subsystem - VNA, mm-Wave modules, RF cables, probes etc
- AUT or mm-Wave module mounts

  • Probe Roll/Z stage (Not available for use with mm-Wave modules)
  • Rolling floor stand with integrated equipment rack
  • Probes
  • Width - 23.6” (600 mm)
  • Depth - 23.6” (600 mm)
  • Height - 28.7” (730 mm)
  • System Weight - 40 lb (18 kg) excluding computer, controller & RF equipment

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